SUPERSCAN™ SS-4000

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SUPERSCAN SS-4000

 

SUPERSCANは、株式会社島津製作所またはその関係会社の日本およびその他の国における商標です。
使用されている技術は、US7193222、EP2082413、DE202008018179、CZ 301692、US8779368、CZ305388、EA021273、CZ 304824、CZ305883などの特許によって保護されています。 BrightBeam、Wide Field Optics、In-Flight Beam Tracing、およびEssenceは、TESCAN GROUP, a.s.の商標です。
Windowsは、米国Microsoft Corporationの米国およびその他の国における登録商標または商標です。

特長

  • Ultimate Imaging with Low Energy Beam
    Ultimate Imaging with Low Energy Beam
    BrightBeam テクノロジーにより、非導電性材料やビームに弱い材料も低加速条件で超高分解能観察が可能。

    図：ナノポーラス金触媒
    　　加速電圧 0.5 keV、ビーム減速モード、
    　　100 nm In-Beamアキシャル検出器（SE）、WD 1.38 mm
  • Enhanced Real–time Observation
    Enhanced Real–time Observation
    広域2倍SEM像観察、自動補正と調整で操作性向上、高精細画像を短時間で実現。

    図：まつかさ
    　　加速電圧 5.0 keV、Wide Field モード、
    　　E-T 検出器（SE）、WD 71.5 mm、視野（FoV） 84 mm
  • Sensitive Low-Vacuum Imaging
    Sensitive Low-Vacuum Imaging
    水蒸気雰囲気で信号増幅、生体試料の低真空高感度観察。ビームダメージに弱い試料に最適。※)

    図：植物トライコーム
    　　加速電圧 5.0 keV、100 Pa、
    　　GSD 検出器（SE）、水蒸気雰囲気、無蒸着

    ※) SS-4000 GMUモデルのみ
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