SUPERSCAN™ SS-2000

走査電子顕微鏡

Add Bookmark

SUPERSCAN SS-2000

 

SUPERSCANは、株式会社島津製作所またはその関係会社の日本およびその他の国における商標です。
BrightBeam、Wide Field Optics、In-Flight Beam Tracing、およびEssenceはTESCAN GROUP, a.s.の商標です。
Windowsは、米国Microsoft Corporationの米国およびその他の国における登録商標または商標です。

特長

More
{"title":"\u30c0\u30a6\u30f3\u30ed\u30fc\u30c9","description":"\u6700\u65b0\u306e\u30ab\u30bf\u30ed\u30b0\u306a\u3069\u3092\u30c0\u30a6\u30f3\u30ed\u30fc\u30c9\u3067\u304d\u307e\u3059\u3002","source":"product","key":5769,"max":30,"filter_types":["brochures"],"link_title":"View other Downloads","link_url":"","pdf_links":[]} {"title":"\u30a2\u30d7\u30ea\u30b1\u30fc\u30b7\u30e7\u30f3","source":"product","key":5769,"max":3,"filter_types":["applications","application_note","posters"],"link_title":"More","link_url":"\/products\/surface-analysis\/scanning-electron-microscope\/ss-2000\/applications.html","config_list":[],"page_links":[{"type":"page","link_title":"\u30a2\u30d7\u30ea\u30b1\u30fc\u30b7\u30e7\u30f3\u4f8b","link_url":"\/products\/surface-analysis\/scanning-electron-microscope\/ss-2000\/applications.html#anchor_0","time":""}],"column_title":"Documents"} {"title":"\u30c6\u30af\u30cb\u30ab\u30eb\u30c9\u30ad\u30e5\u30e1\u30f3\u30c8","source":"product","key":5769,"max":3,"filter_types":["technical","technical_reports","white_papers","primers"],"link_title":"More","link_url":"\/products\/surface-analysis\/scanning-electron-microscope\/ss-2000\/applications.html#tbaleAnchor_technical","config_list":[],"page_links":[],"column_title":"Documents"} {"title":"\u30de\u30cb\u30e5\u30a2\u30eb","source":"product","key":5769,"max":3,"filter_types":["manuals"],"link_title":"More","link_url":"\/products\/surface-analysis\/scanning-electron-microscope\/ss-2000\/applications.html#tbaleAnchor_manual","config_list":[],"page_links":[],"column_title":"Documents"}

News / Events

More