本ソフトウェアは、島津マイクロフォーカスX線CTシステムinspeXio SMX-225CT FPD HRおよび計測用X線CTシステムXDimensus 300にて撮影した断面画像の金属アーチファクトを低減させる再構成演算ソフトウェアです。本ソフトウェアをご使用いただくことで、金属アーチファクトが低減した断面画像にて構造解析や内部観察が可能です。

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{"title":"\u30c0\u30a6\u30f3\u30ed\u30fc\u30c9","description":"Download the latest brochure.","source":"product","key":3493,"max":"30","filter_types":["brochures"],"link_title":"View other Downloads","link_url":"","pdf_links":[]} {"title":"\u30a2\u30d7\u30ea\u30b1\u30fc\u30b7\u30e7\u30f3","source":"product","key":3493,"max":"3","filter_types":["applications","application_note","posters"],"link_title":"More","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-ct-system-software\/metal-artifact-reduction-software\/applications.html","config_list":[],"page_links":[],"column_title":"Documents"} {"title":"\u30c6\u30af\u30cb\u30ab\u30eb\u30c9\u30ad\u30e5\u30e1\u30f3\u30c8","source":"product","key":3493,"max":"3","filter_types":["technical","technical_reports","white_papers","primers"],"link_title":"More","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-ct-system-software\/metal-artifact-reduction-software\/applications.html#tbaleAnchor_technical","config_list":[],"page_links":[],"column_title":"Documents"} {"title":"\u30de\u30cb\u30e5\u30a2\u30eb","source":"product","key":3493,"max":"3","filter_types":["manuals"],"link_title":"More","link_url":"\/products\/non-destructive-testing\/microfocus-x-ray-ct-system-software\/metal-artifact-reduction-software\/applications.html#tbaleAnchor_manual","config_list":[],"page_links":[],"column_title":"Documents"}

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